Features

• X-ray source: Philips high intensity ceramic sealed tube (3kW)
• Wavelength: Cu Ka (1.5405 Å)
• Incident beam optics: 2 interchangeable fixed slits and one Soller slit.
• Diffracted beam optics: fixed slit plus programmable receiving slit, graphite analyzer
• Detectors: sealed proportional counter and X'celerator PSD for high speed data collection
• Sample stage: powder stage, texture cradle with sample translation
• Software: Philips X’PERT suite: Data Collector, Graphics & Identify, Texture
  

  XPERT Powder (I) - for high-speed phase identification	XPERT Thin Film (II) - for thin film, grazing-incidence XRD, texture measurement

Example Data

XRD data of a curundum plate collected on XPERT powder diffractometer