The ZSX Primus IV is Rigaku’s newest and most powerful XRF spectrometer. As a wavelength dispersive sequential spectrometer, the Primus IV boasts rapid qualitative and semi-quantitative analysis of a wide range of elements: from Boron to Uranium, without the need for standards. With standards, the Primus IV is capable of determining quantitative compositional analysis down to the sub ppm. Using a scintillation detector for heavier elements and a gas-filled detector for lighter elements, the Primus IV boasts a high sensitivity and resolution for all sample types. Typical applications for XRF include research and development, as well as quality control for metal, cement, mineral, petrochemical, and polymer industries.

Some key features of this spectrometer include:

• An Integrated helium flush system for analysis of loose powder and liquid samples
• 500 micron resolution mapping feature for elemental topography and distribution
•  Sample rotation to reduce orientation effects and improve data for small samples
• Variable measuring diameter allows for analysis of samples as small as 500 microns
•  Automated sample changer for up to 48 samples